Kongyi Li obtained his bachelor’s degree in physics and Ph.D. in Condensed Matter Physics at Xiamen University, China. His research was concentrated on the topics of the light-matter interaction in III-Nitride semiconductors and the assembly and transport properties of artificial two-dimensional materials.
After graduation, Kongyi started a 2-year postdoctoral research at the Eindhoven University of Technology. He mainly focused on the studies of electrical transport measurement and in-situ manipulation by using four-probe Scanning Tunneling Microscopy (STM).
Since 2018, he joined QuTech as a Nano-characterization Engineer in the group of Leo Kouwenhoven. His attention now has been shifted to Focus Ion Beam (FIB) sample preparation, Scanning Electron Microscope (SEM) automation as well as corresponding image and data analysis.
If he's not too busy, Kongyi likes to while away the time watching movies, photographing, and playing tennis.